Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to nonconductive state
Reexamination Certificate
2005-01-11
2005-01-11
Niebling, John F. (Department: 2812)
Semiconductor device manufacturing: process
Making device array and selectively interconnecting
Using structure alterable to nonconductive state
C438S601000, C257S529000
Reexamination Certificate
active
06841425
ABSTRACT:
Methods for treating a wafer to protect a fuse box of a semiconductor chip are provided. These methods include applying an insulating coating solution onto the surface of at least one of a plurality of fuse boxes in a semiconductor chip so as to prevent moisture or impurities from seeping into the fuse box. With these methods, the degradation of the semiconductor chip can be substantially reduced by protecting the fuse box from a high-temperature and very humid atmosphere, and impurities such as particles. Thus, characteristics and reliability of the semiconductor chip can be also improved.
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Bang Jeong-Ho
Chae Hyo-Geun
Lee Jae-Il
Lee Young-Moon
Kennedy Jennifer M.
Marger & Johnson & McCollom, P.C.
Niebling John F.
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