4. Communications: electrical
  5. Condition responsive indicating system
  6. Specific condition

Innes K. MacKenzie

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Method and apparatus for measuring ice thickness on substrates u

Communications: electrical – Condition responsive indicating system – Specific condition
Patent

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Method and apparatus for measuring ice thickness on substrates u

Communications: electrical – Condition responsive indicating system – Specific condition
Patent

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Method and apparatus for measuring thickness of coating...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Method and apparatus for measuring thickness of paint layers on

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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Method and device for estimating bone mineral content of the...

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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Profile ID: LFUS-PAI-P-526151

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