Communications: electrical – Condition responsive indicating system – Specific condition
Patent
1997-07-29
1998-10-13
Hofsass, Jeffery A.
Communications: electrical
Condition responsive indicating system
Specific condition
340580, 25032009, 378 89, 364563, G08B 1902
Patent
active
058218629
ABSTRACT:
The present invention provides a method and apparatus for in situ measuring thicknesses of ice buildup on airfoil. The method and device uses a probe including a high energy radioactive gamma ray source .sup.241 Am producing 60 keV photons which penetrate through the airfoil substrate and a photodetector mounted behind the source for detection of backscattered photons. The probe is mounted on the interior of the airfoil and secondary radiation is backscattered within the ice layer and back through the airfoil substrate to the photodetector. The shape and density of the source holder in addition to the geometrical arrangement of the source and detector with respect to the airfoil substrate are used to block photons backscattered in the airfoil substrate thereby favoring scattering in the ice layer over that in the aluminum.
REFERENCES:
patent: 3539808 (1970-11-01), Hahn
patent: 3914607 (1975-10-01), Cho et al.
patent: 4047029 (1977-09-01), Allport
patent: 4054255 (1977-10-01), Magenheim
patent: 4593533 (1986-06-01), Alsenz
patent: 4628736 (1986-12-01), Kirby et al.
patent: 4646068 (1987-02-01), Skala
patent: 4688185 (1987-08-01), Magenheim et al.
patent: 4701868 (1987-10-01), Regimand
patent: 4797660 (1989-01-01), Rein, Jr.
patent: 5014042 (1991-05-01), Michoud et al.
patent: 5125017 (1992-06-01), Lempriere
patent: 5195117 (1993-03-01), Ong
patent: 5296853 (1994-03-01), Federow et al.
patent: 5351689 (1994-10-01), MacKenzie
patent: 5446288 (1995-08-01), Tumer
patent: 5557108 (1996-09-01), Tumer
Article entitled "An Axially Symmetric Gamma-Ray Backscatter System for DuMond Spectrometry" by Innes K. MacKenzie, 1990 (5 pages).
Article entitled "In Situ Density Measurement in Aqueous Solutions by the Gamma-Ray Backscattering Method" by A. Gayer, S. Bukshpan and D. Kedem, 1982 (3 pages).
Conference Record of 1991 Forty-Third Annual Conference of Electrical Engineering Problems in the Rubber and Plastics Industries, "Gamma Backscatter Thickness Measurement for Control of Multiple-Strip Rubber Calenders" by Joel R. Bates and Chris Bickel, 1991 (3 pages).
Dowell Ralph A.
Hofsass Jeffery A.
Lee Benjamin C.
Schumacher Lynn C.
University of Guelph
LandOfFree
Method and apparatus for measuring ice thickness on substrates u does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring ice thickness on substrates u, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring ice thickness on substrates u will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-317069