4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Test or calibration structure

Indranil De

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Apparatus and methods for detection of systematic defects

Data processing: structural design – modeling – simulation – and em – Modeling by mathematical expression
Reexamination Certificate

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Apparatus and methods for determining and localization of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Multi-region processing system and heads

Coating processes – Coating by vapor – gas – or smoke
Reexamination Certificate

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Robust measurement of parameters

Data processing: measuring – calibrating – or testing – Calibration or correction system
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Profile ID: LFUS-PAI-P-2850756

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