Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Inventor
active
Apparatus and method for performing parallel test on...
Burn-in test apparatus for BGA packages using forced heat...
Connector for testing a semiconductor package
Multichip package test
No associations
LandOfFree
Hyun-Seop Shim does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Hyun-Seop Shim, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Hyun-Seop Shim will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2843196