4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Quality evaluation

Hsin-Chih Tai

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Backside illuminated imaging sensor with light reflecting...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate

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Backside illuminated imaging sensor with vertical pixel sensor

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Reexamination Certificate

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Method and system of semiconductor fabrication fault analysis

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Wafer dicing using scribe line etch

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Making plural separate devices
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2951751

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