4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Hong-bae Moon

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Method for monitoring defects of semiconductor device

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Scrubbing equipment for a semiconductor device using laser dista

Cleaning and liquid contact with solids – Apparatus – Automatic controls
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Wafer testing process of a semiconductor device comprising a red

Fishing – trapping – and vermin destroying
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Hong-bae Moon does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Hong-bae Moon, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Hong-bae Moon will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-330935

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure