4. Static information storage and retrieval
  5. Powering

Hiroyoshi Tsuboi

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Level shifter

Electronic digital logic circuitry – Interface – Logic level shifting
Reexamination Certificate

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Semiconductor device and semiconductor device testing method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and method for testing the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor memory device having a second voltage supplier...

Static information storage and retrieval – Powering
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2525592

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