Hiroyasu Nakayama

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Apparatus and method of testing a semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Pattern generator and test apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor device testing apparatus and method for...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Semiconductor tester

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Test apparatus and test method

Multiplex communications – Diagnostic testing
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Profile ID: LFUS-PAI-P-443811

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