Semiconductor tester

Details Semiconductor tester Semiconductor tester

2006-03-21

2006-03-21

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S755090

Reexamination Certificate

active

07015685

ABSTRACT:
A semiconductor tester for testing a semiconductor device by generating pulses of different repetition periods to a DUT having ports of different periods (frequencies) without using plural timing memories holding timing sets. The semiconductor tester required to generate a timing edge pulse of a period M different from a test period N of the semiconductor tester comprises period converting means capable of generating a timing edge pulse of the period M different from the period N of the test rate without using timing set that the semiconductor tester has.

REFERENCES:
patent: 5212443 (1993-05-01), West et al.
patent: 5477139 (1995-12-01), West et al.
patent: 5592659 (1997-01-01), Toyama et al.
patent: 6275057 (2001-08-01), Takizawa
patent: 6522126 (2003-02-01), Hanai et al.
patent: 6587976 (2003-07-01), Yun et al.
patent: 6-347519 (1994-12-01), None
Patent Abstracts of Japan, publication No.: 06-347519, publication date Dec. 22, 1994.
International Search Report, application No.: PCT/JP02/12122, 2 pages.

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