4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Field effect device
  6. Having insulated electrode

Hiroshi Yanagita

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Defective product inspection apparatus, probe positioning...

Scanning-probe techniques or apparatus; applications of scanning – Auxiliary means serving to assist or improve the scanning...
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Defective product inspection apparatus, probe positioning...

Radiant energy – Inspection of solids or liquids by charged particles
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Defective product inspection apparatus, probe positioning...

Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Scanning tunnelling microscopy or apparatus therefor – e.g.,...
Reexamination Certificate

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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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