4. Optical: systems and elements
  5. Lens
  6. With variable magnification

Hiroshi Nomura

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Aberration measuring method, aberration measuring system and...

Optics: measuring and testing – Lens or reflective image former testing
Reexamination Certificate

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Address generator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Adjusting mechanism of a lens barrel

Patent

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Alignment apparatus, aberration measuring method and aberration

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Alignment mark for use in making semiconductor devices

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
Patent

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Profile ID: LFUS-PAI-P-66649

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