4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Hiroaki Yamoto

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Application specific event based semiconductor memory test...

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means
Reexamination Certificate

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Circuit structure for testing microprocessors and test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Event based IC test system

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Event based semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Event based semiconductor test system

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1214982

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