4. Optics: measuring and testing
  5. By particle light scattering
  6. With photocell detection

Hermantha K. Wickramasinghe

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Apparatus for patterning recording media

Dynamic information storage or retrieval – Storage or retrieval by simultaneous application of diverse... – Magnetic field and light beam
Reexamination Certificate

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Apparatus for patterning recording media

Dynamic information storage or retrieval – Storage or retrieval by simultaneous application of diverse... – Magnetic field and light beam
Reexamination Certificate

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Non-planarized, self-aligned, non-volatile phase-change...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Particulate inspection of fluids using interferometric light mea

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning thermal profiler

Thermal measuring and testing – Distance or angle
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Profile ID: LFUS-PAI-P-1438597

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