Thermal measuring and testing – Distance or angle
Patent
1986-04-30
1988-05-31
Guchlinski, Jr., William A.
Thermal measuring and testing
Distance or angle
374124, 374164, 136228, G01N 2500
Patent
active
047476982
ABSTRACT:
Apparatus is provided for investigating surface structures irrespective of the materials involved. A fine scanning tip is heated to a steady state temperature at a location remote from the structure to be investigated. Thereupon, the scanning tip is moved to a position proximate to, but spaced from the structure. At the proximate position, the temperature variation from the steady state temperature is detected. The scanning tip is scanned across the surface sturcture with the aforesaid temperature variation maintained constant. Piezo electric drivers move the scanning tip both transversely of, and parallel to, the surface structure. Feedback control assures the proper transverse positioning of the scanning tip and voltages thereby generated replicate the surface structure to be investigated.
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"Tiniest Tools Probe a Cell's Molecules," Science News, vol. 128, Sept. 14, 1985, p. 167.
Wickramasinghe Hermantha K.
Williams Clayton C.
Guchlinski, Jr. William A.
International Business Machines Corp.
Will Thomas B.
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