Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-09-25
2007-09-25
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C430S005000, C430S022000, C430S030000
Reexamination Certificate
active
10709205
ABSTRACT:
A method of performing latch up check on an integrated circuit (IC) design that comprises rasterizing a conductor region shape and contact shapes and iteratively expanding the contact shapes within the conductor region shape using a cellular algorithm. Direction values for contact cells can be used to limit the number of neighboring cells which must be explored. In every fourth iteration of the expansion process, corner cells may not be expanded. Reachable areas outside of conductors can also be explored.
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Bonges, III Henry A.
Reynolds David C.
Sundquist James E.
Cohn, Esq. Howard M.
Do Thuan
Rossoshek Helen
Schnurmann H. Daniel
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