4. Coating apparatus
  5. Gas or vapor deposition
  6. Work support

Hanspeter Ott

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Defining a pattern on a substrate

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Defining a pattern on a substrate

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Defining a pattern on a substrate

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Vacuum transfer device

Material or article handling – Apparatus for moving material between zones having different... – For carrying standarized mechanical interface type
Patent

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Wafer holder method and apparatus in a vacuum deposition system

Coating apparatus – Gas or vapor deposition – Work support
Patent

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Profile ID: LFUS-PAI-P-836456

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