4. Excavating

Hajime Hiroi

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Ball grid array-integrated circuit testing device

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Cooling system of a semiconductor testing device

Automatic temperature and humidity regulation – Ventilator type – Electrically actuated
Patent

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Cooling system of a semiconductor testing device using a control

Electricity: electrical systems and devices – Safety and protection of systems and devices – Circuit interruption by thermal sensing
Patent

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Data logging apparatus with memory and pattern testing device

Excavating
Patent

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Profile ID: LFUS-PAI-P-67613

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