Cooling system of a semiconductor testing device using a control

Details Cooling system of a semiconductor testing device using a control Cooling system of a semiconductor testing device using a control

1998-06-12

1999-12-21

Jackson, Stephen W.

Electricity: electrical systems and devices

Safety and protection of systems and devices

Circuit interruption by thermal sensing

361115, H02H 500

Patent

active

060057629

ABSTRACT:
There is provided a cooling system of a semiconductor testing device using a control computer capable of controlling the number of revolutions of a fan so as to obtain proper air-flow corresponding to the heating value for every operating mode of a measuring unit, thereby preventing the power from being wasted and enabling the supervision of the operating modes of the entire system. The cooling system includes a fan which is rotated by a DC motor, a temperature sensor for measuring a temperature of a measuring unit which is cooled by the fan, a control computer for reading temperature information and revolution information. The control computer transmits a control signal for controlling the number of revolutions of the fan to a fan control.multidot.power supply unit for executing optimum control of the number of revolutions of the fan corresponding to heating value for every operating mode of the measuring unit.

REFERENCES:
patent: 5075606 (1991-12-01), Lipman

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