4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Gustavo A. Pinto

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Chemical mechanical polishing test structures and methods...

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate

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Chemical mechanical polishing test structures and methods...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Inspectable buried test structures and methods for...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Inspectable buried test structures and methods for...

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Electrical characteristic sensed
Reexamination Certificate

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Media servowriting system

Dynamic magnetic information storage or retrieval – Automatic control of a recorder mechanism – Controlling the head
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Profile ID: LFUS-PAI-P-2440451

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