4. Excavating

Gregory L. Cowan

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Output data compression scheme for use in testing IC memories

Excavating
Patent

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Output data compression scheme for use in testing IC memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Semiconductor integrated circuit having compression circuitry fo

Excavating
Patent

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Semiconductor integrated circuit having compression...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit having compression...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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