4. Static information storage and retrieval
  5. Read/write circuit
  6. Precharge

Giuseppe La Rosa

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Auto-programmable current limiter to control current leakage due

Static information storage and retrieval – Read/write circuit – Precharge
Patent

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Line monitoring of negative bias temperature instabilities...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Method and circuit for element wearout recovery

Electronic digital logic circuitry – Reliability
Reexamination Certificate

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Method and device for array threshold voltage control by...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate

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PMOSFET device with localized nitrogen sidewall implantation

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1294267

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