4. Static information storage and retrieval
  5. Systems using particular element
  6. Magnetoresistive

Gerhard Poeppel

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Method for fault analysis in wafer production

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Method of making discrete trap memory (DTM) mediated by...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Spin device

Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2251353

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