Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2009-03-12
2010-12-07
Pizarro, Marcos D (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S315000, C257S410000, C257SE51001, C257SE51002, C257SE51003, C257SE51004, C257SE51005, C257SE51006, C257SE29170, C257SE21050, C257SE21520, C977S773000, C977S763000, C438S257000, C438S260000, C438S261000, C438S287000, C438S288000
Reexamination Certificate
active
07847325
ABSTRACT:
A discrete trap memory, comprising a silicon substrate layer, a bottom oxide layer on the silicon substrate layer, a Fullerene layer on the bottom oxide layer, a top oxide layer on the Fullerene layer, and a gate layer on the top oxide layer; wherein the Fullerene layer comprises spherical, elliptical or endohedral Fullerenes that act as charge traps.
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Poeppel Gerhard
Tempel Georg
Garrity Diana C
Infineon - Technologies AG
Pizarro Marcos D
Slater & Matsil L.L.P.
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