4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Georg Farkas

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Arrangement for testing integrated circuits

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Integrated circuit with self-test device for an embedded...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Non-volatile memory and accelerated test method for address...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2803539

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