4. Static information storage and retrieval
  5. Powering

Futoshi Igaue

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Semiconductor device including internal voltage generation...

Static information storage and retrieval – Powering
Reexamination Certificate

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Semiconductor device including internal voltage generation...

Static information storage and retrieval – Powering
Reexamination Certificate

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Semiconductor device undergoing defect detection test

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Semiconductor device with a well wherein a scaling down of...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2380182

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