4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Distributive type parameters

Frederic Allibert

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Composite substrate and method of fabricating the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Composite substrate and method of fabricating the same

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates
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Method and apparatus for measuring a lifetime of charge...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate

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Method of fabricating a composite substrate with improved...

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
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Profile ID: LFUS-PAI-P-2305630

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