4. Static information storage and retrieval
  5. Systems using particular element
  6. Flip-flop

Franklin Duan

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Method and apparatus for characterizing shared contacts in...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Methodology to measure many more transistors on the same...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Reduced soft error rate (SER) construction for integrated...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Single channel four transistor SRAM

Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate

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Test structures in unused areas of semiconductor integrated...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
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Profile ID: LFUS-PAI-P-2506976

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