Optics: measuring and testing
By polarized light examination
Of surface reflection
Inventor
active
Compound semiconductors and a method for thin film growth
Compound semiconductors and a method for thin film growth
Defect and etch rate control in trench etch for dual...
FeRAM capacitor stack etch
FeRAM sidewall diffusion barrier etch
No associations
LandOfFree
Francis G. Celii does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Francis G. Celii, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Francis G. Celii will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-187608