4. Excavating

Fazal Ur Rehman Qureshi

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Built in self test (BIST) for multiple RAMs

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Built in self test BIST for RAMS using a Johnson counter as a so

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Circuitry for handling high impedance busses in a scan...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and apparatus for testing analog and digital circuitry wi

Excavating
Patent

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Scan flip-flop that simultaneously holds logic values from a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-620933

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