4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Eliezer Rosengaus

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Daisy chained topology

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Edge bead removal inspection by reflectometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Edge bead removal inspection by reflectometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Edge bead removal inspection by reflectometry

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Emission microscopy system

Facsimile and static presentation processing – Facsimile – Specific signal processing circuitry
Patent

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Profile ID: LFUS-PAI-P-1116345

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