4. Excavating

Edward J. Heitzeberg

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Devices and method for testing cell margin of memory devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Devices and methods for testing cell margin of memory devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Imaging device and method of manufacture

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate

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Parity and error correction coding on integrated circuit address

Excavating
Patent

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Profile ID: LFUS-PAI-P-1145079

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