4. Measuring, testing, or signalling instruments
  5. Measuring, regulating or indicating instrument, or casing
  6. Geometric

Dong-hun Kang

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Fabrication methods of a ZnO thin film structure and a ZnO...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate

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Gas sensor and method thereof

Electrolysis: processes – compositions used therein – and methods – Electrolytic analysis or testing – For oxygen or oxygen containing compound
Reexamination Certificate

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Nano-elastic memory device and method of manufacturing the same

Semiconductor device manufacturing: process – Making point contact device
Reexamination Certificate

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Nano-elastic memory device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Point contact device
Reexamination Certificate

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Tape measure

Measuring – testing – or signalling instruments – Measuring – regulating or indicating instrument – or casing – Geometric
Patent

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Profile ID: LFUS-PAI-P-70975

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