4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Dieter Rathei

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Method and apparatus for fast automated failure...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Method for efficient analysis semiconductor failures

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Method for semiconductor yield loss calculation

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method of and system for analyzing cells of a memory device

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Method of monitoring a semiconductor manufacturing trend

Data processing: measuring – calibrating – or testing – Measurement system – Remote supervisory monitoring
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Profile ID: LFUS-PAI-P-2491184

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