4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Delmas R. Buckley, Jr.

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Method and system for incremental behavioral validation of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Single-pass methods for generating test patterns for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Single-pass, concurrent-validation methods for generating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2213884

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