4. Electrical transmission or interconnection systems
  5. Nonlinear reactor systems
  6. Parametrons

David R. Resnick

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Apparatus and method for memory with bit swapping on the fly...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Apparatus and method for memory with bit swapping on the fly...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Apparatus and method for testing memory cards

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Built-in self-test system for VLSI circuit chips

Excavating
Patent

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Conditional latch circuit

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent

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Profile ID: LFUS-PAI-P-224840

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