4. Thermal measuring and testing
  5. Temperature measurement
  6. In spaced noncontact relationship to specimen

David Mordo

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Bichannel radiation detection method

Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
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Method and apparatus for UV exposure of low dielectric...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Formation of semi-insulative polycrystalline silicon
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Method for improving mechanical properties of low dielectric...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
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Method to improve mechanical strength of low-k dielectric...

Semiconductor device manufacturing: process – Radiation or energy treatment modifying properties of...
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Method to improve mechanical strength of low-K dielectric...

Coating processes – Direct application of electrical – magnetic – wave – or... – Pretreatment of substrate or post-treatment of coated substrate
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Profile ID: LFUS-PAI-P-1999466

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