4. Electrical transmission or interconnection systems
  5. Nonlinear reactor systems
  6. Parametrons

David M. Wu

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Basic DCVS circuits with dual function load circuits

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent

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By-pass boundary scan design

Excavating
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Common test logic for multiple operation modes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Flexible scan architecture

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Fully testable DCVS circuits with single-track global wiring

Boots – shoes – and leggings
Patent

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Profile ID: LFUS-PAI-P-518240

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