4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

David G. Alexander

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Method for detecting adjustment error in photolithographic...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method for electronically measuring size of internal void in...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Method for erasing flash electrically erasable programmable...

Static information storage and retrieval – Floating gate – Particular biasing
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Process for fabricating semiconductor memory device with...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
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Pseudo three-dimensional image display and method of...

Printed matter – Having revealable concealed information – fraud preventer or... – Utilizing electromagnetic radiation
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Profile ID: LFUS-PAI-P-2029736

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