4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Darren Slawecki

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Clock network

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating
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Comparison circuit and method for verification of scan data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Duty cycle compensation in clock circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Rectangular or pulse waveform width control
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Method and apparatus for on die clock shrink burst mode

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating
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On-die automatic selection of manipulated clock pulse

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Profile ID: LFUS-PAI-P-2848242

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