Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Reexamination Certificate
2005-05-10
2005-05-10
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Signal generation or waveform shaping
C438S006000
Reexamination Certificate
active
06892157
ABSTRACT:
A circuit and method to automatically identify and manipulate a pulse in each of a sequence of clocking signals for an integrated circuit includes a clock manipulation circuit to manipulation the identified pulse including to shrink or otherwise alter the identified pulse; and a pulse identification circuit to automatically and algorithmically identify each pulse to be shrunk.
REFERENCES:
patent: 5239481 (1993-08-01), Brooks et al.
patent: 5790200 (1998-08-01), Tsujimoto et al.
patent: 6127858 (2000-10-01), Stinson et al.
patent: 6237115 (2001-05-01), Ting et al.
patent: 6549022 (2003-04-01), Cole et al.
Rotter Stephan
Slawecki Darren
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Raymond Edward
LandOfFree
On-die automatic selection of manipulated clock pulse does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with On-die automatic selection of manipulated clock pulse, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and On-die automatic selection of manipulated clock pulse will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3461954