4. Image analysis
  5. Applications
  6. Personnel identification

Cristian Presura

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Alignment system and lithographic apparatus equipped with...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Ellipsometer, measurement device and method, and...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Ellipsometer, measurement device and method, and...

Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate

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Optical speckle pattern investigation

Image analysis – Applications – Personnel identification
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2321379

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