4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Chih-Ming Ke

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Approach to improve ellipsometer modeling accuracy for...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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CD SEM automatic focus methodology and apparatus for...

Radiant energy – Inspection of solids or liquids by charged particles – Methods
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Line end spacing measurement

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
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Line end spacing measurement

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
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Measurement of overlay offset in semiconductor processing

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
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Profile ID: LFUS-PAI-P-1495480

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