Chiaki Takubo

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Apparatus and method for inspecting an LSI device in an assembli

Image analysis – Applications – Manufacturing or product inspection
Patent

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Ball grid array type package for semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate

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Board for evaluating the characteristics of a semiconductor chip

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Circuit pattern for multi-layer circuit board for mounting...

Electricity: conductors and insulators – Conduits – cables or conductors – Preformed panel circuit arrangement
Reexamination Certificate

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Contact sheet for testing electronic parts, apparatus for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Profile ID: LFUS-PAI-P-40971

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