4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition

Chia-Yun Chen

Inventor

Rate now
  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Inventor

active

Device for ESD protection circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Inspection methods for a semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of defect inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Method of managing wafer defects

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

No associations

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Chia-Yun Chen does not yet have a rating. At this time, there are no reviews or comments for this inventor.

If you have personal experience with Chia-Yun Chen, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Chia-Yun Chen will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-P-2420913

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure