4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Charlie Han

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Alternate timing wafer burn-in method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Cascade-type chip module

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Chip mounted on chip
Patent

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Circuit for burn-in operation on a wafer of memory devices

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Direct contact through hole type wafer structure

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate

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Direct contact through hole type wafer structure

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Multiple housings
Reexamination Certificate

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Profile ID: LFUS-PAI-P-520437

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