4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Chad Everett Winemiller

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Automatically creating manufacturing test rules pertaining...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
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Integrated circuit with in situ circuit arrangement for...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Methods, systems and media for functional simulation of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Methods, systems and media for managing functional...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Network processor probing and port mirroring

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
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Profile ID: LFUS-PAI-P-2438364

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