Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-26
2007-06-26
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
11053220
ABSTRACT:
Methods, systems, and media for managing functional verification of a parameterizable design are disclosed. Embodiments include a system having a testbench configuration module adapted to configure a testbench, the testbench having testbench signals and one or more instantiated components having a plurality of ports of a generic design, where the testbench signals are wired to the plurality of ports. The testbench may also have one or more instantiated special components based on chip-specific versions of the design where the special components are wired to the same ports as the generic design. The system may also include a functional verification manager that, through a component module, observes values in the testbench and automatically configure a verification environment based on the observed values, including automatic insertion of checkers at different levels of hierarchy. The testbench may be a VHDL or Verilog testbench in some embodiments.
REFERENCES:
patent: 6182258 (2001-01-01), Hollander
patent: 6490711 (2002-12-01), Buckley, Jr.
patent: 6530054 (2003-03-01), Hollander
patent: 6581191 (2003-06-01), Schubert et al.
patent: 6591403 (2003-07-01), Bass et al.
patent: 7165231 (2007-01-01), Buckley, Jr.
Likovich, Jr. Robert Brian
Mendenhall Joseph David
Morris John Christopher
Otero David
Winemiller Chad Everett
Cockburn Joscelyn G.
Doan Nghia M.
International Business Machines - Corporation
Schubert Osterrieder & Nickelson PLLC
Siek Vuthe
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