Carl M. Roberts

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Aluminum-backed wafer and chip

Patent

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Wafer level capped sensor

Measuring and testing – Surface and cutting edge testing
Reexamination Certificate

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Wafer level capped sensor

Measuring and testing – Surface and cutting edge testing
Reexamination Certificate

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Wafer level capped sensor

Measuring and testing – Surface and cutting edge testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

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Profile ID: LFUS-PAI-P-1100747

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