4. Static information storage and retrieval
  5. Systems using particular element
  6. Flip-flop

Bo Jin

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Advanced probe card and method of fabricating same

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Array of dice for testing integrated circuits

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Content addressable memory cell

Static information storage and retrieval – Associative memories – Ferroelectric cell
Reexamination Certificate

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Liquid crystal display for performing time divisional color...

Computer graphics processing and selective visual display system – Plural physical display element control system – Display elements arranged in matrix
Reexamination Certificate

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Lot-optimized wafer level burn-in

Semiconductor device manufacturing: process – With measuring or testing
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Profile ID: LFUS-PAI-P-2382031

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